News

Dresden Center for Nanoanalysis co-organized conferences in Dresden

From April 14th until April 16th 2015 the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) was held in the Hilton hotel in Dresden. The conference was co-organized by cfaed's technology platform Dresden Center for Nanoanalysis (DCN). It focused on the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. In total 141 people from 11 countries participated in the meeting, among others from Germany, the USA, Japan and Korea. The tours to the state-of-the-art metrology facilities at Global Foundries and Fraunhofer IPMS-CNT attracted much attention.
Directly following this meeting, the 3rd Dresden Nanoanalysis Symposium was held on Friday April 17th. It was organized by DCN in cooperation with the Dresden Fraunhofer Cluster Nanoanalysis. A total of 81 attendees joined to listen to a variety of talks, from fundamental research to the industrial perspective. The winner of the poster competition was Sebastian Schneider from IFW Dresden with the Poster “Exploring the properties of individual nanomagnets: EMCD on FePt nanocubes”.