Equipment and Methods

If you want to use one of the listed tools by yourself, please get in contact with us.
For "Full Service" please fill and submit an Examination Task.

Microscopy & Spectroscopy with X-rays, Electrons and Ions

Zeiss / Xradia Versa 520 - X-ray microscope

  • Nano-Indenter - In-house development, (under construction)

FEI Helios 660 - Dual-Beam FIB

  • Kleindiek MM3A - Manipulator for in-situ electrical characterization
  • Hysitron / Bruker PI87 - Pico indenter
  • In-situ heater, max. 400 °C (in-house development)
  • Ar+ milling system (FEI prototype)

Zeiss GeminiSEM 500 - Scanning electron microscope

  • Oxford XMaxN 150 - 150 mm2 EDX detector system
  • Oxford Nordlys Nano - EBSD

JEOL Jem F-200C - Transmission electron microscope

  • JEOL window-less Dual EDX system
  • Gatan OneView - In-situ 4K camera
  • Gatan Continuum - Dual EELS/EFTEM system
  • Protochips Atmosphere 210 - In-situ gas/heating holder with gas supply and
    residual gas analyzer
  • Protochips Poseidon Select - In-situ liquid and electro-chemistry holder
  • Protochips Fusion II - In-situ heating and electrical bias holder
  • Mel-Build LN2 Atmos Defend - In-situ double-tilt LN2 cooling holder

Modeling & Simulation Tools

  • Total Resolution MacTempas & Crystal Kit – HR-(S)TEM contrast simulation
  • HREM Research - Focus & tilt series reconstruction
  • AnSys Mechanical – Finite element software for the modeling of mechanical properties
  • Synopsis Simpleware ScanIP – Modeling, visualization & segmentation software
  • Thermo Fisher Avizo - Visualization & segmentation software

Sample Preparation

  • Gatan PIPS II i-load - Ion mill
  • Fischione Nanomill with vacuum transfer - Scanning ion beam
    polishing system
  • Fischione Model 1070 NanoClean - Plasma cleaner
  • Classical TEM preparation:
    • ATM Saphir 530 Pro-Mech. grinding and polishing system
    • ATM Saphir Vibro - Ultra-fine polishing system
    • Fischione Model 130 - Specimen punch
    • Fischione Model 160 - Specimen grinder
    • Fischione Model 170 - Ultrasonic disc cutter
    • Fischione Model 180 - XTEM prep kit
    • Fischione Model 200 - Dimpling grinder
  • Zeiss Axio-Imager - Reflected-light microscope
  • Zeiss Invert K.mat - Inverse reflected-light microscope
  • Various optical (stereo) microscopes
  • Presi Poly Vac - Vacuum cold mounting system
  • Variety of saws etc.

(Status: January, 2020)


The equipment and methods available within the DCN can be used either by requesting a service investigation conducted by a DCN expert, or – after registration and a device-specific training – by booking the requested tool through DCN’s online booking system and running the experiment her- or himself.

The rules according to which the equipment and methods available at the DCN can be accessed by registered users depend on both their relation to and the level of collaboration with the DCN and the TU Dresden, respectively:

  • Members of the TU Dresden or another public research institution, who are partner to the DCN within a scientific collaboration, may use the equipment free of charge.
  • Members of the TU Dresden or another public research institution, who request support for a project, which is not a scientific collaboration with the DCN, are charged the project-related expenses. Since the DCN is listed as a device center in the RIsources database of the German Science Foundation (DFG), (limited) coverage of these expenses can be applied for within DFG projects.
  • Any other interested person (e.g., from a company) may as well book the equipment of the DCN and will be accordingly charged.

For detailed information on user registration and pricing, please, contact us!