1st Dresden Nanoanalysis Symposium (DNS), 2013
Three selected papers of the 1st DNS have been published in Advanced Engineering Materials.
Fraunhofer IZFP Dresden
Fraunhofer IWS Dresden
Fraunhofer IFAM Dresden
Speakers and Talks
Robert Sinclair, Stanford University, Stanford/CA, USA
The Stanford Nanocharacterization Laboratory and Recent Applications of the Aberration-Corrected ETEM
Gerd Schneider, Helmholtz-Zentrum Berlin, Germany
Nanoscale X-ray Spectroscopy and Tomography with Synchroton Radiation
Joachim Mayer, Ernst-Ruska-Zentrum Jülich, Germany
Correcting the Chromatic Aberration: PICO and its Applications
Malgorzata Lewandowska, Technical University Warsaw, Poland
Nanograin Aluminum - Process, Properties, Nanoanalysis
Rainer Rauh, EADS München, Germany
Nanotechnology - Accelerating Future Aircraft
Christoph Gerber, University of Basel, Switzerland
The Future of AFM Technologies in Life Sciences
George Smith, Oxford University, United Kingdom
Atom Probe Tomography: Some 3D Atomic-Scale Studies of Semiconductors and Catalysts
Hans-Jürgen Engelmann, GLOBALFOUNDRIES Dresden, Germany
Challenges to Structural and Materials Characterization in Leading-Edge Semiconductor Devices
Congratulations to the Posterprize Winners of the 1st Dresden Nanoanalysis Symposium:
1st: Thomas Rauscher
"Nanoanalysis of Novel Amorphous Electrode Materials by in-situ Electrochemical STM"
TU Dresden, Institute of Materials Science
2nd: Eric Jehnes
"Large area structuring of nanorod arrays by laser interference lithography"
TU Dresden, Institute for Applied Photophysics (IAPP)
3rd: Jan Sickmann
"Strain mapping of tensile strained transistors by dark-field off-axis electron holography"
TU Dresden, Triebenberg Laboratory for Electron Microscopy and Electron Holography