1st Dresden Nanoanalysis Symposium (DNS), 2013
The 1st Dresden Nanoanalysis Symposium (DNS) took place on April 26, 2013 and had been jointly organized by TU Dresden and the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Three selected papers of the 1st DNS have been published in Advanced Engineering Materials.
Scientific Committee
Ehrenfried Zschech
Fraunhofer IZFP Dresden
Lukas Eng
TU Dresden
Andreas Leson
Fraunhofer IWS Dresden
Michael Mertig
TU Dresden
Thomas Weißgärber
Fraunhofer IFAM Dresden
Speakers and Talks
 Robert Sinclair, Stanford University, Stanford/CA, USA The Stanford Nanocharacterization Laboratory and Recent Applications of the Aberration-Corrected ETEM |
Gerd Schneider, Helmholtz-Zentrum Berlin, Germany Nanoscale X-ray Spectroscopy and Tomography with Synchroton Radiation |
Correcting the Chromatic Aberration: PICO and its Applications |
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Malgorzata Lewandowska, Technical University Warsaw, Poland Nanograin Aluminum - Process, Properties, Nanoanalysis |
Rainer Rauh, EADS München, Germany Nanotechnology - Accelerating Future Aircraft |
 Christoph Gerber, University of Basel, Switzerland The Future of AFM Technologies in Life Sciences |
 George Smith, Oxford University, United Kingdom Atom Probe Tomography: Some 3D Atomic-Scale Studies of Semiconductors and Catalysts |
Hans-Jürgen Engelmann, GLOBALFOUNDRIES Dresden, Germany Challenges to Structural and Materials Characterization in Leading-Edge Semiconductor Devices |
Joachim Mayer, Ernst-Ruska-Zentrum Jülich, Germany
Poster Prize
Congratulations to the Posterprize Winners of the 1st Dresden Nanoanalysis Symposium:
1st: Thomas Rauscher
"Nanoanalysis of Novel Amorphous Electrode Materials by in-situ Electrochemical STM"
TU Dresden, Institute of Materials Science
2nd: Eric Jehnes
"Large area structuring of nanorod arrays by laser interference lithography"
TU Dresden, Institute for Applied Photophysics (IAPP)
3rd: Jan Sickmann
"Strain mapping of tensile strained transistors by dark-field off-axis electron holography"
TU Dresden, Triebenberg Laboratory for Electron Microscopy and Electron Holography
Michael Mertig and Ehrenfried Zschech with the Posterprize Winner (from left to right):
Thomas Rauscher, Eric Jehnes, Jan Sickmann
